Assessment of attachment in psychosis: A psychometric cause for concern
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Michael F. Green | D. Penn | S. Reise | Junghee Lee | W. Horan | R. Kern | C. Olbert | Michael F. Green
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Michael F. Green | D. Penn | S. Reise | Junghee Lee | W. Horan | R. Kern | C. Olbert | Michael F. Green