论文信息 - Investigation of Sidewall High-k Interfacial Layer Effect in Gate-All-Around Structure - 字舞流文

Investigation of Sidewall High-k Interfacial Layer Effect in Gate-All-Around Structure

Byung-Gook Park | Jong-Ho Lee | D. Ryu | Munhyeon Kim | Junsu Yu | Sangwan Kim | Donghyun Ryu