Phase-ambiguity-free and accurate permittivity determination from waveguide measurements.

A microwave method has been proposed for accurate and unique extraction of relative complex permittivity (εr) of dielectric materials from 2π phase-ambiguity-free amplitude-only two-port and one-port scattering parameter measurements. Improved accuracy has been shown by the applied uncertainty analysis. For the validation of our method, εr of low-loss and lossy samples was extracted.