Characterization of vacuum-evaporated In70Se30 thin films

This paper discusses the properties of thermally evaporated polycrystalline In70Se30 thin films (Tsb=303-473K). Structural and surface morphology of the film were identified by X-ray diffractogram and Scanning Electron Microscopy. The composition was verified by EDAX and XPS spectrum. The results of conductivity measurements (Tsb =303K) have revealed that thermionic emission and variable range hopping (VRH) are the two dominant conduction mechanisms in the temperature ranges of (230-280 K) and (170-220 K) respectively.