Remote Tracking of Phase Changes in Cr2AlC Thin Films by In-situ Resistivity Measurements
暂无分享,去创建一个
J. Schneider | D. Primetzhofer | C. Scheu | M. Hans | B. Völker | C. Scheu | R. Sahu | B. Stelzer | Pascal Bliem | Xiang Chen | Bastian Stelzer
暂无分享,去创建一个
J. Schneider | D. Primetzhofer | C. Scheu | M. Hans | B. Völker | C. Scheu | R. Sahu | B. Stelzer | Pascal Bliem | Xiang Chen | Bastian Stelzer