论文信息 - Remote Tracking of Phase Changes in Cr2AlC Thin Films by In-situ Resistivity Measurements - 字舞流文

Remote Tracking of Phase Changes in Cr2AlC Thin Films by In-situ Resistivity Measurements

J. Schneider | D. Primetzhofer | C. Scheu | M. Hans | B. Völker | C. Scheu | R. Sahu | B. Stelzer | Pascal Bliem | Xiang Chen | Bastian Stelzer