The performance of compact thermal models for LED package

A method for creating compact thermal models of single-chip and multi-chip LED package is developed and evaluated with good agreement between the finite volume simulation and experimental data. The different compact thermal models for LED package are checked against detail model under 38 boundary conditions. The junction temperature predictions from the single-thermal-resistance model are within 16% for all boundary conditions. And the star-thermal-resistance model gives the most consistent and accurate prediction for the junction temperature, within 5% for all boundary conditions. Based on creating star-thermal-resistance model of single-chip LED package, the compact thermal model of multi-chip LED package is established, in which interacting thermal resistance is taken into account because of the thermal coupling effect between the chips.

[1]  Jean Paul Freyssinier,et al.  Solid-state lighting: failure analysis of white LEDs , 2004 .

[2]  Andras Poppe,et al.  New approaches in the transient thermal measurements , 2000 .

[3]  E. Schubert,et al.  Junction–temperature measurement in GaN ultraviolet light-emitting diodes using diode forward voltage method , 2004 .

[4]  E.G.T. Bosch Thermal compact models: an alternative approach , 2003 .

[5]  W. A. Phillips,et al.  Degradation of GaN-based quantum well light-emitting diodes , 2008 .

[6]  Moo Whan Shin,et al.  Thermal analysis of GaN-based LEDs using the finite element method and unit temperature profile approach , 2004 .

[7]  M.-N. Sabry,et al.  Compact thermal models for electronic systems , 2003 .

[8]  Moo Whan Shin,et al.  Thermal Resistance Measurement of LED Package with Multichips , 2007, IEEE Transactions on Components and Packaging Technologies.

[9]  M. Shin,et al.  Implementation of Side Effects in Thermal Characterization of RGB Full-Color LEDs , 2007, IEEE Electron Device Letters.

[10]  K. Skadron,et al.  Parameterized physical compact thermal modeling , 2005, IEEE Transactions on Components and Packaging Technologies.

[11]  Gaudenzio Meneghesso,et al.  High temperature electro-optical degradation of InGaN/GaN HBLEDs , 2007, Microelectron. Reliab..

[12]  G. Farkas,et al.  Thermal investigation of high power Optical Devices by transient testing , 2005, IEEE Transactions on Components and Packaging Technologies.

[13]  Robert A. Griffin,et al.  Compact thermal models of packages used in conduction cooled applications , 2000 .

[14]  V. Székely,et al.  Fine structure of heat flow path in semiconductor devices: a measurement and identification method , 1988 .

[15]  Andras Poppe,et al.  THERMAN: a thermal simulation tool for IC chips, microstructures and PW boards , 2000 .