Guided Electromagnetic Wave Technique for IC Authentication

Counterfeiting of an Integrated Circuit (IC) has become a significant concern for electronics manufacturers, system integrators, and end users. It is necessary to find a robust implementation that is efficient, low cost, and noninvasive in detection and avoidance of ICs counterfeiting. In this paper, we introduce the concept of using a guided radiofrequency (RF) wave technique to authenticate ICs. The approach discussed in this work highlights the use of electromagnetic (EM)/radiofrequency (RF) response that has been further evaluated to assign fingerprint or signature of ICs for the purpose of authentication. Our approach is to use EM/RF guided wave to sense the response of the ICs, extract the manufacturing-based process variation of an IC and finally generate identifier or signature of that IC. As a proof-of-concept, we performed experiments over different field-programmable gate array (FPGA) boards of the same family. The post-processing technique was applied on the measurement results to statistically quantify the error probability of the authentication technique.

[1]  Thomas O. Boucher,et al.  Reliability, validity, and imprecision in fuzzy multicriteria decision-making , 2002, IEEE Trans. Syst. Man Cybern. Part C.

[2]  Ayman I. Kayssi.  Macromodeling C- and RC-loaded CMOS inverters for timing analysis , 1996, Proceedings of the Sixth Great Lakes Symposium on VLSI.

[3]  Etienne Perret,et al.  Towards a robust and efficient EM based authentication of FPGA against counterfeiting and recycling , 2017, 2017 19th International Symposium on Computer Architecture and Digital Systems (CADS).

[4]  Etienne Perret,et al.  Radiated Electromagnetic Emission for Integrated Circuit Authentication , 2017, IEEE Microwave and Wireless Components Letters.

[5]  Ingrid Verbauwhede,et al.  PUFKY: A Fully Functional PUF-Based Cryptographic Key Generator , 2012, CHES.

[6]  Chulhan Lee,et al.  Changeable Biometrics for Appearance Based Face Recognition , 2006, 2006 Biometrics Symposium: Special Session on Research at the Biometric Consortium Conference.

[7]  Etienne Perret,et al.  Authentication of Microcontroller Board Using Non-Invasive EM Emission Technique , 2018, 2018 IEEE 3rd International Verification and Security Workshop (IVSW).

[8]  Patrick Bas,et al.  Physical object authentication: Detection-theoretic comparison of natural and artificial randomness , 2016, 2016 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP).

[9]  H. Otake,et al.  Circuit simulation of a silicon-carbide MOSFET considering the effect of the parasitic elements on circuit boards by using S-parameters , 2018, 2018 IEEE Applied Power Electronics Conference and Exposition (APEC).

[10]  Kaushik Roy,et al.  Parameter Variation Tolerance and Error Resiliency: New Design Paradigm for the Nanoscale Era , 2010, Proceedings of the IEEE.

[12]  Domenic Forte,et al.  Tutorial T4: All You Need to Know about Hardware Trojans and Counterfeit ICs , 2014, VLSI Design.

[13]  Ulrich Rührmair,et al.  PUFs in Security Protocols: Attack Models and Security Evaluations , 2013, 2013 IEEE Symposium on Security and Privacy.

[14]  Alanson P. Sample,et al.  EM-ID: Tag-less identification of electrical devices via electromagnetic emissions , 2016, 2016 IEEE International Conference on RFID (RFID).

[15]  Dylan F. Williams,et al.  The Relationship Between Switch-Term-Corrected Scattering-Parameters and Wave-Parameters Measured With a Two-Port Vector Network Analyzer , 2018, IEEE Microwave and Wireless Components Letters.

[16]  Srinivas Devadas,et al.  Physical Unclonable Functions and Applications: A Tutorial , 2014, Proceedings of the IEEE.

[17]  C. Hagleitner,et al.  Multi-transducer recordings from a single-chip gas sensor system coated with different polymers , 2003, TRANSDUCERS '03. 12th International Conference on Solid-State Sensors, Actuators and Microsystems. Digest of Technical Papers (Cat. No.03TH8664).

[18]  Mark Mohammad Tehranipoor,et al.  Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain , 2014, Proceedings of the IEEE.

[19]  Mark Mohammad Tehranipoor,et al.  Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead , 2014, J. Electron. Test..

[20]  Yiorgos Makris,et al.  Counterfeit electronics: A rising threat in the semiconductor manufacturing industry , 2013, 2013 IEEE International Test Conference (ITC).

[21]  Glenn E. R. Cowan,et al.  A circuit design and fabrication approach to address global process variation , 2009, 2009 52nd IEEE International Midwest Symposium on Circuits and Systems.

[22]  Etienne Perret,et al.  Robust and Noninvasive IC Authentication Using Radiated Electromagnetic Emissions , 2019, J. Hardw. Syst. Secur..

[23]  Franco Stellari,et al.  Counterfeit IC detection using light emission , 2014, 2014 International Test Conference.

[24]  Sheldon X.-D. Tan,et al.  EM-based on-chip aging sensor for detection and prevention of counterfeit and recycled ICs , 2015, 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).