Simulation of a Short-Channel 4H-SiC UMOSFET with Buried p Epilayer for Low Oxide Electric Field and Switching Loss
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S. Dimitrijev | Z. Wen | Zhanwei Shen | G. Yan | Xingfang Liu | Wanshun Zhao | Guosheng Sun | Yiping Zeng | Lei Wang | Jisheng Han | Feng Zhang | Guoguo Yan | Zhengxin Wen