Gate-Induced Drain Leakage in Ldd and Fully-Overlapped Ldd Mosfets
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Chenming Hu | P. K. Ko | S. A. Parke | P. Nee | J. Moon | J. Huang
[1] A new LDD structure: total overlap with polysilicon spacer (TOPS) , 1990, IEEE Electron Device Letters.
[2] T. Chan,et al. Subbreakdown drain leakage current in MOSFET , 1987, IEEE Electron Device Letters.