论文信息 - Defect States Determining Dynamic Trapping-Detrapping in β-Ga2O3 Field-Effect Transistors - 字舞流文

Defect States Determining Dynamic Trapping-Detrapping in β-Ga2O3 Field-Effect Transistors

N. B. Smirnov | F. Ren | S. Pearton | A. Polyakov | Jihyun Kim | I. Shchemerov | S. Chernykh | Sooyeoun Oh | A. Kochkova | I. Shchemerov