A heuristic approach to technology measurement

Abstract Three approaches to the measurement of advances in technology are described. First is the selection of single parameters which appear to be the primary performance objectives of various technologies. Second is the development of hierarchal sets of parameters which are traded-off in achieving one, or a few, primary measures. Third is the definition of a compound measure of performance relating the ability of artifacts of technology to survive or compete. Case studies are given for each approach. Practical advantages, difficulties, and limitations of these approaches are discussed.