A proposed low-offset sense amplifier for SRAM applications

Random variations play a critical role in determining SRAM yield, by affecting both the bitcell and the read Sense Amplifiers (SA). A low-offset sense amplifier capable of static random access memory (SRAM) applications has been presented in this work. Simulated results show that the proposed sense amplifier has very low offset of 31.284 mV compared to the conventional sense amplifiers.