Errors in nanometrology by SEM
暂无分享,去创建一个
[1] J. Butler,et al. Real and apparent grain sizes in chemical vapor deposited diamond , 2003 .
[2] H. Seiler,et al. Secondary electron emission in the scanning electron microscope , 1983 .
[3] D. Joy,et al. Low Voltage Scanning Electron Microscopy , 1996, Microscopy and Microanalysis.
[4] G. Amaratunga,et al. Growth of high-quality single-wall carbon nanotubes without amorphous carbon formation , 2004 .
[5] J. Cazaux,et al. About the role of the various types of secondary electrons (SE1; SE2; SE3) on the performance of LVSEM , 2004, Journal of microscopy.
[6] I. Müllerová. Imaging of specimens at optimized low and very low energies in scanning electron microscopes. , 2006, Scanning.
[7] H. Lafontaine,et al. Electronic contribution to secondary electron compositional contrast in the scanning electron microscope , 1997 .
[8] J. Pawley. LVSEM for High Resolution Topographic and Density Contrast Imaging , 1992 .
[9] J. Cazaux. Minimum detectable dimension, resolving power and quantification of scanning Auger microscopy at high lateral resolution , 1989 .