论文信息 - Time-resolved frequency chirp measurement using a silicon-wafer etalon

Time-resolved frequency chirp measurement using a silicon-wafer etalon

A new method for determination of time-resolved frequency chirp in modulated light sources of optical communication systems is presented. A thin silicon wafer acting as a low-finesse etalon was used as an optical frequency discriminator. The method provides a polarization-insensitive way to easily characterize the frequency chirp with high time-resolution.

H. Ludvigsen | S. Tammela | T. Kajava | M. Kaivola

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