Strain sensitivity in film and cermet resistors: measured and physical quantities

The strain coefficient of resistivity of resistors deposited on a substrate is analysed, and an expression for its correlation to the measurable longitudinal and transverse gauge factors is given for isotropic (metal, amorphous semiconductor and cermet) resistors. The use of this expression for the evaluation of other physical quantities is exemplified by the calculation of the temperature coefficients of resistivity for resistors on substrates of different thermal expansivity.