论文信息 - A simple model for stress voiding in passivated thin film conductors

A simple model for stress voiding in passivated thin film conductors

A model is proposed for stress voiding in passivated thin film conductors. The rate limiting step is argued to be the formation of vacancies at dislocation jogs which then diffuse to void sites.

J. R. Lloyd | Eduard Arzt | E. Arzt | J. Lloyd

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