Accurate signature driven power conscious tuning of RF systems using hierarchical performance models

In this research, a new post-manufacture tuning approach for yield improvement of advanced RF systems is developed. The proposed method first determines module level performances from the system level response (signature) to an applied RF diagnostic test using top-down model diagnosis. Then a constrained optimizer is used to determine the best module level tuning parameter values that satisfy system level specifications (bottom-up analysis) based on the determined performances of the individual modules in a power-conscious manner. Both top-down and bottom-up analysis techniques are supported by hierarchical RF behavioral models. The health (effects of process variations) of individual modules affects the relationship between module level tuning parameters and module level performance metrics and is factored into the tuning procedure. A key benefit of the proposed approach is that only a single test application is needed. Simulation results and hardware data prove the efficiency of the proposed tuning technique.