Specific features for the analysis of fringe images
暂无分享,去创建一个
Salah Bourennane | Klaus Spinnler | Thomas Wittenberg | Yannick Caulier | T. Wittenberg | S. Bourennane | K. Spinnler | Y. Caulier
[1] Peter E. Hart,et al. Nearest neighbor pattern classification , 1967, IEEE Trans. Inf. Theory.
[2] J. Leendertz,et al. Interferometric displacement measurement on scattering surfaces utilizing speckle effect , 1970 .
[3] Richard O. Duda,et al. Pattern classification and scene analysis , 1974, A Wiley-Interscience publication.
[4] Petros Maragos,et al. Morphological skeleton representation and coding of binary images , 1984, IEEE Trans. Acoust. Speech Signal Process..
[5] John R. Tyrer,et al. Application of ESPI to three-dimensional vibration measurements , 1991 .
[6] J. Villain,et al. Combination of numerical and experimental methods for stress analysis of small electronic components , 1991 .
[7] Huang Zhi,et al. Interpretation and classification of fringe patterns , 1992, Proceedings., 11th IAPR International Conference on Pattern Recognition. Vol. III. Conference C: Image, Speech and Signal Analysis,.
[8] Wolfgang Osten,et al. Application of neural networks and knowledge-based systems for automatic identification of fault-indicating fringe patterns , 1994, Other Conferences.
[9] Wolfgang Osten,et al. Knowledge-assisted evaluation of fringe patterns for automatic fault detection , 1994, Optics & Photonics.
[10] W. N. Wang,et al. Reliability testing of solder joints in surface mounted assembly using real-time holographic interferometry , 1995, 1995 Proceedings. 45th Electronic Components and Technology Conference.
[11] Xide Li. Wavelet transform for detection of partial fringe patterns induced by defects in nondestructive testing of holographic interferometry and electronic speckle pattern interferometry , 2000 .
[12] Wolfgang Osten,et al. Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors , 2000, Electronic Imaging.
[13] Ian Witten,et al. Data Mining , 2000 .
[14] Wolfgang Osten,et al. Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors , 2001, J. Electronic Imaging.
[15] Szymon Rusinkiewicz,et al. Stripe boundary codes for real-time structured-light range scanning of moving objects , 2001, Proceedings Eighth IEEE International Conference on Computer Vision. ICCV 2001.
[16] N. Chubachi,et al. Application of holographic interferometry measuring technique to deformation measurement of bone due to thermal stress , 2002, IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276).
[17] Anand Asundi,et al. Fault detection by interferometric fringe pattern analysis using windowed Fourier transform , 2005 .
[18] Sören Kammel,et al. Deflektometrische Untersuchung spiegelnd reflektierender Freiformflächen , 2005 .
[19] Ichirou Yamaguchi,et al. Surface Shape Measurement by Dual-wavelength Phase-shifting Digital Holography , 2006 .
[20] Rajpal S. Sirohi,et al. Optical Measurement Techniques , 2006 .