A general Monte Carlo simulation of ED-XRF spectrometers. II: Polarized monochromatic radiation, homogeneous samples

Abstract A general Monte Carlo code for the simulation of X-ray fluorescence spectrometers, described in a previous paper is extended to predict the spectral response of instruments employing polarized exciting radiation. Details of the calculation method specific for the correct simulation of photon-matter scatter interactions in case of polarized X-ray beams are presented. Comparisons are made with experimentally collected spectral data obtained from a monochromatic X-ray fluorescence setup installed at a synchrotron radiation source. The use of the simulation code for quantitative analysis of intermediate and massive samples is also demonstrated.