Improving the testability of mixed-signal integrated circuits

The author presents a discussion on several methods that can be used to improve the testability of mixed-signal integrated circuits. He begins by outlining the role of test, and its impact on product cost and qualify. A brief look is taken at the pending test crises for mixed-signal circuits. Subsequently, the author outlines several common test strategies, and their corresponding test setups for verifying the function of the analog portion of a mixed-signal circuit. In the remainder of the paper he describes several analog test buses and circuits for built-in self-test applications.

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