Improvement of the contraction‐type LP test algorithm for finding all solutions of piecewise‐linear resistive circuits

In this letter, an effective technique is proposed for improving the computational efficiency of the contraction-type LP test algorithm, which is an algorithm for finding all solutions of piecewise-linear resistive circuits. Using the proposed technique, all solutions of a large-scale problem, where the number of variables is 100 and the number of linear regions is 10100, could be found in less than 10 min using a 360 MHz computer. Copyright 2001 John Wiley & Sons, Ltd.