Controlling X-ray deformable mirrors during inspection.

The X-ray deformable mirror (XDM) is becoming widely used in the present synchrotron/free-electron laser facilities because of its flexibility in correcting wavefront errors or modification of the beam size at the sample location. Owing to coupling among the N actuators of an XDM, (N + 1) or (2N + 1) scans are required to learn the response of each actuator one by one. When the mirror has an important number of actuators (N) and the actuator response time including stabilization or the necessary metrology time is long, the learning process can be time consuming. In this work, a fast and accurate method is presented to drive an XDM to a target shape usually with only three or four measurements during inspection. The metrology data are used as feedback to calculate the curvature discrepancy between the current and the target shapes. Three different derivative estimation methods are introduced to calculate the curvature from measured data. The mirror shape is becoming close to the target through iterative compensations. The feasibility of this simple and effective approach is demonstrated by a series of experiments.

[1]  G. G. Stokes "J." , 1890, The New Yale Book of Quotations.

[2]  Peter Z. Takacs,et al.  Design Of A Long Trace Surface Profiler , 1987, Photonics West - Lasers and Applications in Science and Engineering.

[3]  Guillaume Dovillaire,et al.  A 2 D high accuracy slope measuring system based on a Stitching Shack Hartmann Optical Head. , 2014, Optics express.

[4]  Maurizio Vannoni,et al.  Adaptive x-ray mirror tuning simulation through influence functions’ modeling and error function minimization , 2015 .

[5]  Zach DeVito,et al.  Opt , 2017 .

[6]  Anand Asundi,et al.  Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry , 2010 .

[7]  Qian Kemao,et al.  Windowed Fourier transform for fringe pattern analysis. , 2004, Applied optics.

[8]  Shinan Qian,et al.  The penta‐prism LTP: A long‐trace‐profiler with stationary optical head and moving penta prism (abstract)a) , 1995 .

[9]  Frank Siewert,et al.  Characterization of a piezo bendable X-ray mirror. , 2016, Journal of synchrotron radiation.

[10]  Robert K. Tyson Introduction to Adaptive Optics , 2000 .

[11]  T. Zeschke,et al.  The Nanometer Optical Component Measuring Machine: a new Sub-nm Topography Measuring Device for X-ray Optics at BESSY , 2004 .

[12]  Michael Unser,et al.  B-spline signal processing. I. Theory , 1993, IEEE Trans. Signal Process..

[13]  T. Ishikawa,et al.  Microstitching interferometry for x-ray reflective optics , 2003 .