Analysis of the lateral resolution of electrostatic force gradient microscopy
暂无分享,去创建一个
P. Girard | A. N. Titkov | Erkki Lähderanta | P. Girard | E. Lähderanta | A. Titkov | P. Alekseev | A. Lashkul | M. S. Dunaevskiy | Prokhor A. Alekseev | A. V. Lashkul | M. Dunaevskiy
[1] H. W. Lau,et al. Visualizing charge transport in silicon nanocrystals embedded in SiO2 films with electrostatic force microscopy , 2004 .
[2] J. E. Stern,et al. Contact electrification using force microscopy. , 1989, Physical review letters.
[3] Hayoung Chung,et al. Real-time evolution of trapped charge in a SiO2 layer: An electrostatic force microscopy study , 2001 .
[4] P. Girard,et al. Measurements of electric potential in a laser diode by Kelvin Probe Force Microscopy , 2000 .
[5] A. M. Baró,et al. Resolution enhancement and improved data interpretation in electrostatic force microscopy , 2001 .
[6] Leszek Adamowicz,et al. Charging and discharging processes of carbon nanotubes probed by electrostatic force microscopy , 2006 .
[7] P. Girard,et al. Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interest and Application to Characterisation of Semiconductor Materials and Devices , 2006 .
[8] H. Atwater,et al. Localized charge injection in SiO2 films containing silicon nanocrystals , 2001 .
[9] C. Guthmann,et al. Relationship between charge distribution and its image by electrostatic force microscopy , 2003 .
[10] Federico Capasso,et al. Single p-type/intrinsic/n-type silicon nanowires as nanoscale avalanche photodetectors. , 2006, Nano letters.
[11] Alvarado,et al. Observation of single charge carriers by force microscopy. , 1990, Physical review letters.
[12] Konstantin K. Likharev,et al. Single-electron devices and their applications , 1999, Proc. IEEE.
[13] A. V. Ankudinov,et al. Voltage distributions and nonoptical catastrophic mirror degradation in high power InGaAs/AlGaAs/GaAs lasers studied by Kelvin probe force microscopy , 2003 .
[14] Charles M. Lieber,et al. Growth of nanowire superlattice structures for nanoscale photonics and electronics , 2002, Nature.
[15] Myung-Hwan Whangbo,et al. Phase imaging and stiffness in tapping-mode atomic force microscopy , 1997 .
[16] R. Laiho,et al. Kelvin probe force and surface photovoltage microscopy observation of minority holes leaked from active region of working InGaAs∕AlGaAs∕GaAs laser diode , 2007 .
[17] Panagiotis Dimitrakis,et al. Manipulation of two-dimensional arrays of Si nanocrystals embedded in thin SiO2 layers by low energy ion implantation , 2004 .
[18] J. Son,et al. Kelvin probe force microscopy for conducting nanobits of NiO thin films , 2010, Nanotechnology.