Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in PZT Thin Films
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G. Suchaneck | Xiaomei Lu | G. Gerlach | L. Eng | S. Grafström | C. Loppacher | F. Schlaphof | K. Franke
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G. Suchaneck | Xiaomei Lu | G. Gerlach | L. Eng | S. Grafström | C. Loppacher | F. Schlaphof | K. Franke