论文信息 - Dependency of 1/f Noise on Initial Oxidation Method in Nano-CMOS Technology - 字舞流文

Dependency of 1/f Noise on Initial Oxidation Method in Nano-CMOS Technology

H. Lee | Kyungmin Kim | I. Cho | S. Hwang | I. Han | H. Ji | Y. Kang | Dae-Byung Kim | Jeong‐gun Lee | Seong-Hyung Park | Hee Seung Lee | C. Lee | Sang Young Kim