论文信息 - TID and SEE Characterization of Microsemi's 4th Generation Radiation Tolerant RTG4 Flash-Based FPGA - 字舞流文

TID and SEE Characterization of Microsemi's 4th Generation Radiation Tolerant RTG4 Flash-Based FPGA

TID and SEE characterization of Microsemi's 4th generation RTG4 flash-based FPGA is presented. The radiation performance of RTG4 is compared to SmartFusion2, Microsemi's 4th generation commercial flash-based FPGA.

Nadia Rezzak | Jih-Jong Wang | Durwyn Dsilva | Narayan Jat

[1] J.J. Wang,et al. Total ionizing dose effects on flash-based field programmable gate array , 2004, IEEE Transactions on Nuclear Science.

[2] Nadia Rezzak,et al. Single Event Effects Characterization in 65 nm Flash-Based FPGA-SOC , 2014 .

[3] T. A. Dellin,et al. Radiation response of floating gate EEPROM memory cells , 1989 .

[4] Nadia Rezzak,et al. Total Ionizing Dose Characterization of 65 nm Flash-Based FPGA , 2014, 2014 IEEE Radiation Effects Data Workshop (REDW).

[5] J.J. Wang,et al. Biased-Irradiation Characteristics of the Floating Gate Switch in FPGA , 2006, 2006 IEEE Radiation Effects Data Workshop.