AN ALGORITHM FOR DISTORTION ANALYSIS IN TWO-DIMENSIONAL PATTERNS USING ITS PROJECTIONS

ABSTRACT This paper develops an algorithm for determining the distortion in a two-dimensional pattern from perturbations in its projections. The algorithm is based on the biproportional model which uses the x- and y- projections of the pattern's matrix for distortion analysis. This method is an iterative procedure, adjusting at each iteration its x- and y- projections until they converge. This paper derives the mathematical basis of the method and simulation programs which have been developed. The method is then applied to an example, the image processing of sample cells of human chromosomes with sister chromatid exchanges.