The thermal aberration analysis of a lithography projection lens

In optical lithography tools, thermal aberration of a projection lens, which is caused by lens heating, leads to degradation of imaging quality. In addition to in-line feedforward compensation technology [1], the thermal aberration can be reduced by optimizing projection lens design. Thermal aberration analysis of a projection lens benefits the optimization of projection lens design. In this paper, thermal aberration analysis methods using physical model and simplified model are compared. Physical model of lens heating provides accurate thermal aberration analysis, but it is unable to analyze the contribution of an element of the lens to thermal aberration which is significant for thermal optimization[2]. Simplified model supports thermal analysis of an element of a lens[3]. However, only the deformation of lens surface and the variance of refractive index are considered in the simplified model. The thermal aberration analysis, in this paper, shows not only the deformation of lens surface, the variance of refractive index but also the change of optical path should be considered in thermal aberration analysis. On the basis of the analysis, a strategy for optimizing projection lens design is proposed and used to optimize thermal behavior of a lithography projection lens. The RMS value of thermal aberration is reduced by 31.8% in steady state.

[1]  Tomoyuki Matsuyama,et al.  Thermal aberration control in projection lens , 2008, SPIE Advanced Lithography.

[2]  袁文全 Yuan Wen-quan,et al.  High precision temperature control for projection lens with long time thermal response constant , 2013 .

[3]  Shenq-Tsong Chang,et al.  The refractive lens heat absorption from light source caused thermal aberration analysis , 2014, Optics & Photonics - Optical Engineering + Applications.

[4]  Zhenguang Shi,et al.  Simulated and experimental study of laser-beam-induced thermal aberrations in precision optical systems. , 2013, Applied optics.

[5]  Frank Staals,et al.  Advanced wavefront engineering for improved imaging and overlay applications on a 1.35 NA immersion scanner , 2011, Advanced Lithography.

[6]  Alfred Kwok-Kit Wong,et al.  Resolution enhancement techniques in optical lithography , 2001 .

[7]  Andreas Tünnermann,et al.  Bulk scattering properties of synthetic fused silica at 193 nm. , 2006, Optics express.

[8]  Tomoyuki Matsuyama,et al.  An aberration control of projection optics for multi-patterning lithography , 2011, Advanced Lithography.

[9]  Changcheng Yao,et al.  Simulation Research on the Thermal Effects in Dipolar Illuminated Lithography , 2016 .

[10]  Anthony Yen,et al.  Illuminator design for the printing of regular contact patterns , 1998 .

[11]  Mingyang Ni,et al.  Computational method for simulation of thermal load distribution in a lithographic lens. , 2016, Applied optics.

[12]  Noriaki Tokuda,et al.  Thermal aberration control for low-k1 lithography , 2007, SPIE Advanced Lithography.

[13]  Kenneth E. Goodson,et al.  Modeling resist heating in mask fabrication using a multilayer Green's function approach , 2002, SPIE Advanced Lithography.