论文信息 - Determination of the Refractive Index of Thin Dielectric Films

Determination of the Refractive Index of Thin Dielectric Films

A rapid and accurate method for determining the Brewster angle by the Abeles condition is described. The technique is independent of index of refraction of the substrate and thickness of the film. The indices of refraction can be measured to an accuracy range of about 0.0002 to 0.0006.

Michael Hacskaylo | M. Hacskaylo

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