Initiation of Shockley Stacking Fault Expansion in 4H-SiC P-i-N Diodes
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R. Iijima | H. Okumura | Tomohisa Kato | K. Nakayama | Y. Yonezawa | Aoi Okada | A. Goryu | J. Nishio | C. Ota
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R. Iijima | H. Okumura | Tomohisa Kato | K. Nakayama | Y. Yonezawa | Aoi Okada | A. Goryu | J. Nishio | C. Ota