Electromigration effect of Ni electrodes on the resistive switching characteristics of NiO thin films
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I. Yoo | Myoung-Jae Lee | Chang Bum Lee | B. Kang | S. Ahn | G. Stefanovich | W. Xianyu | B. Park | J. Hur | H. Yin | Ki-Se Kim | Ju-chul Park | Yu-Sun Park