Impact of graded channel (GC) design in fully depleted cylindrical/surrounding gate MOSFET (FD CGT/SGT) for improved short channel immunity and hot carrier reliability
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Subhasis Haldar | R. S. Gupta | Harsupreet Kaur | Sneha Kabra | R. Gupta | H. Kaur | S. Kabra | S. Haldar | S. Bindra | Simrata Bindra
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