论文信息 - Comparison of Genetic and Random Techniques for Test Pattern Generation

Comparison of Genetic and Random Techniques for Test Pattern Generation

* This work has been supported by the Estonian Science Foundation grant G-1850 ABSTRACT: Current paper presents a test pattern generation approach based on genetic algorithms. The algorithm is designed so that it allows direct comparison with random methods. Experimental results on ISCAS'85 benchmarks [6] show that the proposed algorithm performs significantly better than similar approach published in [1]. In addition, the test sets generated by the algorithm are more compact.

Raimund Ubar | Jaan Raik | Eero Ivask

[1] Dan Boneh,et al. On genetic algorithms , 1995, COLT '95.

[2] Irith Pomeranz,et al. On improving genetic optimization based test generation , 1997, Proceedings European Design and Test Conference. ED & TC 97.

[3] Daniel G. Saab,et al. CRIS: a test cultivation program for sequential VLSI circuits , 1992, ICCAD.

[4] Scott Robert Ladd,et al. Genetic algorithms in C , 1995 .

[5] John H. Holland,et al. Adaptation in Natural and Artificial Systems: An Introductory Analysis with Applications to Biology, Control, and Artificial Intelligence , 1992 .

[6] F. Brglez,et al. A neutral netlist of 10 combinational benchmark circuits and a target translator in FORTRAN , 1985 .