I-line photolithographic metalenses enabled by distributed optical proximity correction with a deep-learning model.
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P. Yu | J. Shieh | Wen-Hsien Huang | Guan-Bo Lin | Shih-Wei Chen | H. Liu | Tong-Ke Lin | W. Liao | Yu-Fan Lin | S. Su | Yu-Teng Chen | Tsung-Chieh Tseng | Chun-Chi Chen | Y. Chang