Phase dependence of holographic sensitivity of photorefractive Cu:H:LiNbO3 waveguides

The copper exchange effects in waveguides containing different HxLi1-xNbO3 phases are investigated. We have used x-ray diffraction, m-line spectroscopy in the visible, near UV and IR regions and holographic characterization methods. The crucial dependence of holographic sensitivity on phase composition has been found to be the specific feature of Cu:H:LiNbO3 waveguides. It is established, that the main peculiarities of optical and photorefractive properties are caused by simultaneous formation of Cu+ defects and (OH--Cu+) pair defects.