Application software for analyses of creep crack growth dataEditor's note: The authors have agreed to make the source code for their software available at no cost. Please request the software directly from the authors
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A. M. Sriramamurthy | V. M. Radhakrishnan | M.S.Gopala Krishna | V. Radhakrishnan | A. Sriramamurthy | M. Krishna
[1] A. Saxena. Electrical potential technique for monitoring subcritical crack growth at elevated temperatures , 1980 .
[2] Robert A. Ainsworth,et al. High Temperature Component Life Assessment , 1994 .
[3] Ashok Saxena,et al. Creep crack growth under non-steady-state conditions , 1986 .
[4] Mp Landow,et al. Use of the Direct-Current Electric Potential Method to Monitor Large Amounts of Crack Growth in Highly Ductile Metals , 1990 .
[5] Ka Peters,et al. Application of the Electrical Potential Method to Crack Length Measurements Using Johnson's Formula , 1981 .
[6] R. A. Ainsworth,et al. Consistency of numerical results for power-law hardening materials and the accuracy of the reference stress approximation for J , 1989 .
[7] A. Saxena,et al. Creep crack growth in creep-brittle Ti-6242 alloys , 1992 .
[8] Hermann Riedel,et al. Fracture at high temperatures , 1987 .
[9] T. Nicholas,et al. An experimental investigation of creep crack growth in IN100 , 1981 .