Compendium of Single Event Effects Radiation Test Results from Ball Aerospace & Technologies Corp.

A number of electronic devices have been tested for sensitivity to single event effects for space applications by Ball Aerospace & Technologies Corp. and collaborators. Test conditions and results are presented for each device.

[1]  H.S. Kim,et al.  Recent radiation damage and single event effect results for candidate spacecraft electronics , 2001, 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588).

[2]  H.S. Kim,et al.  Radiation damage and single event effect results for candidate spacecraft electronics , 2000, 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527).

[3]  Stephen LaLumondiere,et al.  Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions , 1997 .

[4]  John M. Bird,et al.  Compendium of Total Ionizing Dose Radiation Test Results from Ball Aerospace & Technologies Corp. , 2009, 2009 IEEE Radiation Effects Data Workshop.

[5]  R. Koga,et al.  Single event transient (SET) sensitivity of Advanced BiCMOS Technology (ABT) buffers and transceivers , 2002, IEEE Radiation Effects Data Workshop.

[6]  K. Kruckmeyer,et al.  Single Event Transient and ELDRS Characterization Test Results for LM4050QML 2.5V Precision Reference , 2010, 2010 IEEE Radiation Effects Data Workshop.