3차원 구조의 차단 게이트를 이용한 2-비트 낸드플래시 메모리의 pinch-off 현상에 따른 최적 읽기 구동 방법

In this study, the optimal read operation method of 3-dimensional Gated Twin-Bit (GTB) NAND Flash Memory was introduced. When the optimal bias is applied to the drain, twin-bit node can be read clearly.