Lattice strain of hydrogen-implanted silicon: Correlation between X-ray scattering analysis and ab-initio simulations
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J. Penot | J. Crocombette | V. Holý | V. Valeš | F. Rieutord | F. Mazen | S. Reboh | L. Capello | L. Bilteanu
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J. Penot | J. Crocombette | V. Holý | V. Valeš | F. Rieutord | F. Mazen | S. Reboh | L. Capello | L. Bilteanu