Correlation of component human body model and charged device model qualification levels with electrical failures in electronics assembly

Abstract Electrostatic discharge sensitivity of integrated circuits is compared with electrical failure levels in electronics assembly. Electrical components with a low electrostatic discharge withstand voltage would be expected to have more electrical failures than more robust components. However, the analysis based on 47 products, 14 facilities, and 6 billion integrated circuits show no correlation between electrical failures and electrostatic discharge sensitivity of components. This was found when the withstand voltage of the components is equal or higher than 100 V human body model and 200 V charged device model.

[1]  K. T. Kaschani.  What is Electrical Overstress? - Analysis and Conclusions , 2015, Microelectron. Reliab..

[2]  T. Smedes,et al.  On the relevance of IC ESD performance to product quality , 2008, EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.

[3]  S. Rachev,et al.  Advanced Stochastic Models, Risk Assessment, and Portfolio Optimization: The Ideal Risk, Uncertainty, and Performance Measures , 2008 .

[4]  Lauri Sydanheimo,et al.  ESD qualification data used as the basis for building electrostatic discharge protected areas , 2015 .

[5]  Michelle Lam,et al.  Auditing of a Class 0 facility , 2013, 2013 35th Electrical Overstress/Electrostatic Discharge Symposium.

[6]  P. Tamminen.  System level ESD discharges with electrical products , 2012, Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012.

[7]  Lauri Sydanheimo,et al.  ESD and disturbance cases in electrostatic protected areas , 2015, 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).

[8]  R. Gaertner,et al.  Is there a correlation between ESD qualification values and the voltages measured in the field? , 2012, Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012.

[9]  Jun Li,et al.  Calculation of Failure Probability of Series and Parallel Systems for Imprecise Probability , 2012 .

[10]  Vladimir Kraz,et al.  Origins of EOS in manufacturing environment and its classification , 2009, 2009 31st EOS/ESD Symposium.

[11]  R. Gaertner.  Do we expect ESD failures in an EPA designed according to international standards? The need for a process related risk analysis , 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).

[12]  S. Halperin,et al.  Process capability & transitional analysis , 2008, EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.