New electrode geometry and potential distribution for soft X-ray drift detectors

Abstract A new electrode geometry for silicon drift chambers is proposed, minimizing the surface of the detector covered with oxide, still maintaining a reasonably high drifting field with no limitation in the det ector size. This Letter describes the design criteria and discusses the peculiar trajectory of signal electrons within the device. The proposed detector is particularly suited for fine spectroscopy measurements of visible light of soft X-rays, where radiation is totally absorbed within a few microns from the interface.