Influence of film thickness on texture and electrical and optical properties of room temperature deposited nanocrystalline V2O5 thin films

Nanocrystalline V2O5 thin films have been grown at low temperature on glass substrates by dc magnetron sputtering using a vanadium metal target. Film thickness was found to have a great impact on the orientation, shape, and size of the crystallites of these films. X-ray diffraction (XRD) patterns of the films with a thickness of 110nm show a strong c-axis orientated crystal structure with a preferred (001) orientation, while those with a thickness of 315nm show mixed orientations (a-axis+c-axis). With further increase in film thickness, an a-axis orientation with predominant (200) reflection was observed in the XRD pattern. The shape of the crystallite changes from a rodlike to a bricklike structure with change in crystallographic orientation from (001) to (200). Atomic force microscopy results were also in agreement with the field emission scanning electron microscopy and XRD results. A direct correlation has been established between the semiconductor to metal transformation of V2O5 films and their cryst...

[1]  D. Kaur,et al.  Structural and optical studies of nanocrystalline V2O5 thin films , 2008 .

[2]  P. Marcus,et al.  Nanostructural modifications of V2O5 thin films during li intercalation studied in situ by AFM , 2007 .

[3]  P. Marcus,et al.  Ageing of V2O5 thin films induced by Li intercalation multi-cycling , 2007 .

[4]  Shuyan Xu,et al.  Nanocrystalline vanadium oxide films synthesized by plasma-assisted reactive rf sputtering deposition , 2007 .

[5]  Xingzhong Zhao,et al.  Effect of thickness on structural, electrical, and optical properties of ZnO: Al films deposited by pulsed laser deposition , 2007 .

[6]  M. El-Desoky,et al.  Electrical and optical properties of highly oriented nanocrystalline vanadium pentoxide , 2005 .

[7]  Hua-gui Zheng,et al.  Synthesis and electrochemical properties of nanocrystalline V2O5 flake via a citric acid-assistant sol–gel method , 2005 .

[8]  L. Ottaviano,et al.  RF sputtered electrochromic V2O5 films , 2004 .

[9]  C. Julien,et al.  Growth and surface characterization of V2O5 thin films made by pulsed-laser deposition , 2004 .

[10]  D. Ingram,et al.  A study of thin films of V2O5 containing molybdenum from an evaporation boat , 2004 .

[11]  Jai Kyeong Kim,et al.  Structural and electrochemical properties of vanadium oxide thin films grown by d.c. and r.f. reactive sputtering at room temperature , 2004 .

[12]  H. Fraser,et al.  Lattice expansion in nanocrystalline niobium thin films , 2003 .

[13]  H. C. Ong,et al.  Dependence of the excitonic transition energies and mosaicity on residual strain in ZnO thin films , 2002 .

[14]  B. S. Naidu,et al.  Low-temperature growth of vanadium pentoxide thin films produced by pulsed laser ablation , 2001 .

[15]  H. H. Liu,et al.  Orientated growth of V2O5 electrochromic thin films on transparent conductive glass by pulsed excimer laser ablation technique , 2000 .

[16]  M. Selim,et al.  Physical properties of vanadium pentoxide sol gel films , 2000 .

[17]  A. Bhattacharya,et al.  Effect of thickness on the optical absorption edge of sputtered vanadium oxide films , 1997 .

[18]  G. Jellison,et al.  Optical functions of transparent thin films of SrTiO(3), BaTiO(3), and SiO(x) determined by spectroscopic ellipsometry. , 1994, Applied optics.

[19]  C. Thompson,et al.  Competition between strain and interface energy during epitaxial grain growth in Ag films on Ni(001) , 1994 .

[20]  C. Sanchez,et al.  Electrical Conductivity of Amorphous V2O5 , 1983, April 16.

[21]  K. Kosuge.  The phase diagram and phase transition of the V2O3−V2O5, system , 1967 .

[22]  A. Rohl,et al.  Computer modelling of V2O5: surface structures, crystal morphology and ethene sorption , 1996 .