论文信息 - Explanation of anomalous erase behaviour and the associated device instability in TANOS Flash using a new trap characterization technique - 字舞流文

Explanation of anomalous erase behaviour and the associated device instability in TANOS Flash using a new trap characterization technique

R. Degraeve | M. Jurczak | B. Kaczer | J. V. Houdt | G. Groeseneken | G. V. D. Bosch | P. Blomme | M. Zahid | L. Breuil | A. Cacciato | A. Rothschild | M. Mercuri