Multi-site test of RF transceivers on low-cost digital ATE

In this paper we present a concept and its implementation for the productive quad-site test of a state-of-the-art 2G/3G RF transceiver device on a low-cost purely digital ATE. Our approach is based on calibrated reference RF transceiver device used as a compact, low-cost RF signal source and RF measurement instrument. The reference device along with supporting analog and digital circuitry for pattern control and test data handling is placed on PCB modules plugged on-top the test DUT board one for each site. The design of the modules, the DUT boards and the software is explained in the context of mass production, and measurement results are given.

[1]  Roland May,et al.  FPGA Architecture for RF Transceiver System and Mixed-Signal Low Cost Tests , 2007, 12th IEEE European Test Symposium (ETS'07).

[2]  Jing Li,et al.  RF Testing on a Mixed Signal Tester , 2007, J. Electron. Test..

[3]  John Ferrario,et al.  Architecting millisecond test solutions for wireless phone RFICs , 2002, Proceedings. International Test Conference.

[4]  Iboun Taimiya Sylla.  Building an rf source for low cost testers using an adpll controlled by texas instruments digital signal processor (DSP) TMS32OC5402 , 2003, International Test Conference, 2003. Proceedings. ITC 2003..

[5]  Larry Zhang,et al.  Low cost multisite testing of quadruple band GSM transceivers , 2005, IEEE International Conference on Test, 2005..

[6]  Mustapha Slamani,et al.  Synthetic DSP approach for novel FPGA-based measurement of error vector magnitude , 2010, 2010 IEEE International Test Conference.

[7]  Friedrich Taenzler,et al.  Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms , 2008, 2008 IEEE International Test Conference.