Combining yield optimization with circuit level electromagnetic simulation (MMIC design)

A method for first-pass MMIC (monolithic microwave integrated circuit) design success is presented. The power of statistical design and modeling is combined with that of circuit-level electromagnetic simulation in a CAD (computer-aided-design) system, providing the ultimate means for predicting production success. The performance of the proposed CAD system is verified by comparing simulated and actual statistical response characteristics of a three-stage, 7-11-GHz low-noise-amplifier GaAs MMIC.<<ETX>>

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