Temperature-Driven Gate Geometry Effects in Nanoscale Cryogenic MOSFETs
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Shoumian Chen | Yuhang Zhao | Yongfeng Cao | Qiming Shao | X. Kou | Zewei Wang | Zhidong Tang | Ao Guo | Xin Luo | Chengwei Cao | Yumeng Yuan | Xiuhao Zhang | Lingge Liu | Jialun Li | ShaoJian Hu | Jialun Li