Multi-element analysis of ceramic and polymeric samples by ArF laser excited atomic fluorescence of ablated plumes

Laser-excited-atomic-fluorescence at the single excitation wavelength of the ArF laser was demonstrated for numerous analytes. These analytes were present in the material plumes produced by pulsed laser ablation of ceramic and polymeric targets. Under minimally destructive conditions, the fluorescence spectra were orders of magnitude brighter than the corresponding laser-induced breakdown spectra. Simultaneous emissions from Al, Ca, Co, Cr, Cu, Fe, In, Mg, Mn, Na, Pb, Sn, and Si were observed. The technique was applied to four analytical problems: the analysis of dried paint for trace lead when μg g−1 detection limits were achieved; the analysis of valuable potteries when two look-alike specimens were differentiated based on practically non-destructive single-shot analysis; the elemental analysis of ink when lines written with different pens could be discriminated without discernable sample destruction even under the microscope; and the analysis of electrode-plastic interfaces when the detection sensitivity was comparable to SIMS. The fluorescence intensity varied with the fluence and the timing of the ArF laser pulse in ways suggestive of particulates in the plume.