Testability measures in pseudorandom testing

The authors present two methods for computing the fault detection probabilities in combinational networks. The methods provide a deeper insight into the effects of signal correlations caused by multiple fan-out reconvergencies and can be used in testability analysis to predict the fault coverage of pseudorandom patterns. The performances of these algorithms have been tested on significant benchmarks and compare favorably with those of previous procedures. >

[1]  Parker,et al.  Design for Testability—A Survey , 1982, IEEE Transactions on Computers.

[2]  M. Ray Mercer,et al.  Correlating Testability with Fault Detection , 1984, ITC.

[3]  Robert Hum,et al.  Applications of Testability Analysis: From ATPG to Critical Delay Path Tracing , 1984, ITC.

[4]  Jacob Savir,et al.  On Random Pattern Test Length , 1984, IEEE Transactions on Computers.

[5]  Gary S. Ditlow,et al.  Random Pattern Testability , 1984, IEEE Transactions on Computers.

[6]  Hans-Joachim Wunderlich PROTEST: A Tool for Probabilistic Testability Analysis , 1985, DAC 1985.

[7]  F. Brglez,et al.  A neutral netlist of 10 combinational benchmark circuits and a target translator in FORTRAN , 1985 .

[8]  Sunil Jain,et al.  Statistical Fault Analysis , 1985, IEEE Design & Test of Computers.

[9]  Ioannis G. Tollis,et al.  Improved Techniques for Estimating Signal Probabilities , 1989, IEEE Trans. Computers.

[10]  Vishwani D. Agrawal,et al.  AN EXACT ANALYSIS FOR EFFICIENT COMPUTATION OF RANDOM-PATTERN TESTABILITY IN COMBINATIONAL CIRCUITS , 1986 .

[11]  Edward J. McCluskey,et al.  Pseudorandom Testing , 1987, IEEE Transactions on Computers.

[12]  Paolo Prinetto,et al.  Random testability analysis: comparing and evaluating existing approaches , 1988, Proceedings 1988 IEEE International Conference on Computer Design: VLSI.

[13]  Edward J. McCluskey,et al.  Probability models for pseudorandom test sequences , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[14]  B. Ricco,et al.  Estimate of signal probability in combinational logic networks , 1989, [1989] Proceedings of the 1st European Test Conference.