A methodology to investigate size scale effects in crystalline plasticity using uniaxial compression testing

[1]  Julia R. Greer,et al.  Size dependence of mechanical properties of gold at the micron scale in the absence of strain gradients , 2005 .

[2]  D. Dimiduk,et al.  Sample Dimensions Influence Strength and Crystal Plasticity , 2004, Science.

[3]  A. G. Evans,et al.  A method for in situ measurement of the residual stress in thin films by using the focused ion beam , 2003 .

[4]  L. Giannuzzi,et al.  The Correlation between Ion Beam/Material Interactions and Practical FIB Specimen Preparation , 2003, Microscopy and Microanalysis.

[5]  Ioannis Chasiotis,et al.  Mechanical measurements at the micron and nanometer scales , 2003 .

[6]  Y. Sharkeev,et al.  The long-range effect in ion implanted metallic materials: dislocation structures, properties, stresses, mechanisms , 2002 .

[7]  M. A. Haque,et al.  Application of MEMS force sensors for in situ mechanical characterization of nano-scale thin films in SEM and TEM , 2002 .

[8]  Robert Puers,et al.  A review of focused ion beam applications in microsystem technology , 2001 .

[9]  J. McCarthy,et al.  FIB micromachined submicron thickness cantilevers for the study of thin film properties , 2000 .

[10]  T. C. Anthony,et al.  Focused ion-beam milling for field-ion specimen preparation:: preliminary investigations , 1998 .

[11]  Anthony G. Evans,et al.  A microbend test method for measuring the plasticity length scale , 1998 .

[12]  R. L. Edwards,et al.  A new technique for measuring the mechanical properties of thin films , 1997 .

[13]  P. Veyssiére,et al.  The effect of prestraining temperature on the mechanical behaviour of Ni3(Al, Hf) single crystals , 1996 .

[14]  M. Ashby,et al.  Strain gradient plasticity: Theory and experiment , 1994 .

[15]  Y. Milman,et al.  Microindentations on W and Mo oriented single crystals: An STM study , 1993 .

[16]  Timothy P. Weihs,et al.  Mechanical deflection of cantilever microbeams: A new technique for testing the mechanical properties of thin films , 1988 .

[17]  R. Howe,et al.  Microfabricated structures for the in situ measurement of residual stress, Young’s modulus, and ultimate strain of thin films , 1987 .

[18]  Donald S. Gardner,et al.  Plastic properties of thin films on substrates as measured by submicron indentation hardness and substrate curvature techniques , 1986 .

[19]  W. Oliver,et al.  Hardness measurement at penetration depths as small as 20 nm , 1983 .

[20]  S. Brenner Plastic Deformation of Copper and Silver Whiskers , 1957 .

[21]  E. Hall,et al.  The Deformation and Ageing of Mild Steel: III Discussion of Results , 1951 .

[22]  Somnath Ghosh,et al.  Materials processing and design : modeling, simulation and applications : NUMIFORM 2004 , 2004 .

[23]  Alfred Wagner,et al.  High Resolution Focused Ion Beams: FIB and Its Applications , 2003 .

[24]  Horacio Dante Espinosa,et al.  A methodology for determining mechanical properties of freestanding thin films and MEMS materials , 2003 .

[25]  William D. Nix,et al.  The Role of Indentation Depth on the Measured Hardness of Materials , 1993 .