대역 소자를 위한 자동 결함 검출 시스템

This paper presents an RF BIST (Built-in Self-Test) circuit for low noise amplifiers. We have developed a new on-chip RF BIST circuit that measures RF parameters of low noise amplifier (LNA) using only DC measurements. This circuit is extremely useful for today’s RFIC devices in a complete RF transceiver environment. The BIST circuit contains test amplifier with programmable capacitor banks and RF peak detectors. The test circuit utilizes output DC voltage measurements and these measured values are translated into the LNA specifications such as input impedance and gain using the mathematical equations. Our on-chip BIST can be self programmed for 1.8㎓, 2.4㎓ and 5.25㎓ low noise amplifiers for GSM, Bluetooth and IEEE802.11g standards. The technique using the proposed circuit is simple and inexpensive.